270263 SE+UE Moderne Methoden zur Charakterisierung von Materialien (2015W)

Introduction to production and properties of X-rays. Fundamental principles of X-ray diffraction. Indexation of X-ray powder patterns (Example 1). Techniques and interpretation of powder diffraction data; qualitative and quantitative analysis of crystalline powders (Rietveld analysis) as well as ab-initio determination of an unknown crystal structure from X-ray powder data (Example 2). Methods of solving the phase problem. Direct methods for structure determination and refinement from X-ray single crystal data (Example 3). Introduction to EPMA (Electron Microprobe Analysis; Example 4).
The introductory course is accompanied by tutored exercises on these major tasks (1-4) and by concomitant training in various computer programs (Fullprof, Oscail, Atoms).