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To enable a smooth and safe start into the semester for all members of the University of Vienna, you can get vaccinated without prior appointment on the Campus of the University of Vienna from Saturday, 18 September, until Monday, 20 September. More information: https://www.univie.ac.at/en/about-us/further-information/coronavirus/.

Warning! The directory is not yet complete and will be amended until the beginning of the term.

270041 VO Characterization of Materials (2021W)

5.00 ECTS (3.00 SWS), SPL 27 - Chemie


Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).


max. 50 participants
Language: German



Currently no class schedule is known.


Aims, contents and method of the course

(Kautek) Fundamentals of Optical and Electron Microscopy, Bright and Dark Field Techniques, Phase and Interference Contrast, Fluorescence Microscopy, Fluorescence Resonance Energy Transfer (FRET), Confocal Microscopy, Nonlinear Optics - Multiphoton Fluorescence Microscopy, Second Harmonic Generation at Interfaces, Laser-Induced Breakdown Spectroscopy (LIBS), Scanning Tunneling Microscopy (STM), Scanning Force Microscopy (SFM), Optical Nearfield (Fundamentals), Aperture Scanning Nonlinear Optical Microscopy (SNOM), Scattering SNOM, Apertureless SNOM, fs-SNOM, Total Internal Reflection Fluorescence (TIRF), Voltammetry of Microparticles (VMP), Electrochemical Quartz Microbalance (EQMB), In-situ Grazing Incidence X-Ray Diffractometry (GIXD), Electrochemical Nanotribology, Electrochemical Laser Activation/Depassivation, Scanning Electrochemical Microscopy (SECM)
(Rupprechter) Infrared-Reflection-Absorption-Spectroscopy (IRAS), Raman Spectroscopy (SERS), X-ray and UV Photoelectron Spectroscopy, Auger Spectroscopy, Microspectroscopy and Spectromicroscopy, X-ray Absorption Spectroscopy (EXAFS), X-Ray Diffraction (XRD), Low-Energy-Electron-Diffraction (LEED), Transmission-Electron-Diffraction (TED), Transmission- and Scanning Electron Microscopy, Analytical Electron Microscopy (SAED, EDX, EELS)

Assessment and permitted materials

Oral examination

Minimum requirements and assessment criteria

Fundamental understanding and interdisciplinary knowledge of the characterization of materials.

Examination topics

Reading list

Notes, script

Association in the course directory

Pflichtmodul Grund- und Angleichung

Last modified: Th 09.09.2021 10:48