Universität Wien FIND
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270084 PR Scanning probe microscopic (2020W)

3.00 ECTS (3.00 SWS), SPL 27 - Chemie
Continuous assessment of course work


Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).


max. 6 participants
Language: German





Aims, contents and method of the course

Gaining practical experience in Atomic Force Microscopy (AFM). Depending on the availability of samples and access to the machine(s), the course may also comprise Scanning-Tunnelling Microscopy (STM) and AFM/Raman Microscopy.

Assessment and permitted materials

Evaluation: experimental work, quality of protocols, final presentation in group seminar.
Your practical work contributes to 50% of the overall score, the protocol 25% and the seminar lecture 25%. You have to reach 75% to pass.

Minimum requirements and assessment criteria

Practical course in tunnelling microscopy. Samples are partly dedicated to this course; partly they come from research activities of the group. The concrete experiments during your lab hence depend on the respective topic. Techniques also encompass imaging from force-distance-curves (for instance Peak Force QNM).

Examination topics

Independent measuring within the group after training on the equipment.

Reading list

Association in the course directory

AN-4, A.5

Last modified: Mo 28.09.2020 15:29