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270284 UE Modern Techniques for Materials' Characterization (2017S)

4.00 ECTS (3.00 SWS), SPL 27 - Chemie
Continuous assessment of course work

Vorbesprechung am Di, 7.3.2017 um 14 h
Seminarraum 4

Registration/Deregistration

Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).

Details

max. 15 participants
Language: German

Lecturers

Classes

Currently no class schedule is known.

Information

Aims, contents and method of the course

A small research project intends to provide an introduction into
(a) the techniques and interpretation of powder diffraction data (XPD, Rietveld analysis) or
(b) to the ab-initio determination of an unknown crystal structure from X-ray single crystal data or
(c) determination of a part of a phase diagram via EPMA, DTA, XPD

Assessment and permitted materials

Minimum requirements and assessment criteria

Examination topics

Reading list


Association in the course directory

PC-1, B.2

Last modified: Mo 07.09.2020 15:42