260102 UE Introduction into Electron Microscopy II - Exercises (2015S)
Continuous assessment of course work
Labels
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from Mo 09.02.2015 08:00 to We 25.02.2015 23:00
- Deregistration possible until Su 22.03.2015 23:00
Details
max. 20 participants
Language: German
Lecturers
Classes
Vorbesprechung: MO 02.03.2015 10.00-11.00, Ort: Erwin-Schrödinger-Hörsaal, Boltzmanngasse 5, 5. Stk., 1090 Wien
MO wtl ab 09.03.2015, 11.00-12.00 Ort: Erwin-Schrödinger-Hörsaal, Boltzmanngasse 5, 5. Stk., 1090 WienAnmeldung über Univis von Mo 09.02.15 08:00 Uhr bis Mi 25.02.15 23:00 Uhr, abmelden bis So 22.03.15 23:00 Uhr.Information
Aims, contents and method of the course
Fields of applications and methods of electron microscopical investigations, electron optics of the microscops, matter waves, electron diffraction and images of crystal structures, quantum interferometry with the electron microscope, demonstration of all electron microscopes of the Faculty of Physics during operation.
Assessment and permitted materials
Oral examination
Minimum requirements and assessment criteria
Electron microscopical investigations are not only used in materials physics but are also of great importance in nanotechnology, biology and medicine. The aim is to understand the scientific background of the electron microscopical methods with a specific focus on quantum interferometry with the electron microscope.
Examination topics
Lecture, discussions, demonstration of the microscopes
Reading list
D. B. Williams, C. B. Carter, Transmission Electron Microscopy (Plenum Press)
B. Fultz and J. Howe, Transmission Electron Microscopy and Diffractometry of Materials (Springer)
L. Reimer, Transmission Electron Microscopy (Springer)
M. De Graef, Conventional Transmission Electron Microscopy (Cambridge Univ. Press)
B. Fultz and J. Howe, Transmission Electron Microscopy and Diffractometry of Materials (Springer)
L. Reimer, Transmission Electron Microscopy (Springer)
M. De Graef, Conventional Transmission Electron Microscopy (Cambridge Univ. Press)
Association in the course directory
MF 2, MF 4, MaG 6, MaG 9, MaG 13, LA-Ph212(3)
Last modified: Mo 07.09.2020 15:41