260067 VO Scattering, Microscopy and Spectroscopy (2024S)
Labels
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
Details
Language: English
Lecturers
Classes (iCal) - next class is marked with N
- Wednesday 06.03. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Thursday 07.03. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Wednesday 13.03. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Thursday 14.03. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Wednesday 20.03. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Thursday 21.03. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Wednesday 10.04. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Thursday 11.04. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Wednesday 17.04. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Thursday 18.04. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Wednesday 24.04. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Thursday 25.04. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Thursday 02.05. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Wednesday 08.05. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Wednesday 15.05. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Thursday 16.05. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Wednesday 22.05. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Thursday 23.05. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Wednesday 29.05. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Wednesday 05.06. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Thursday 06.06. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Wednesday 12.06. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Thursday 13.06. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Wednesday 19.06. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
- Thursday 20.06. 13:00 - 14:30 Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien
Information
Aims, contents and method of the course
Microscopy and various types of spectroscopy are indispensable tools for materials physics, chemistry and biology, and their mastery is vital for wide areas of research. Electron microscopy in particular has become one of the most versatile techniques for materials science.To understand these techniques, the course will provide a unified description of the scattering of both light and particles, and especially of electrons used in electron microscopy. For electron microscopy, we will give explanation of the physical concepts of wave-particle duality, image formation down to atomic resolution, as well as the interaction of such radiation with matter.Complementary to microscopy, a wide variety of spectroscopic techniques are commonplace in materials science. Apart from electron spectroscopies including scanning tunneling spectroscopy, most of these utilize electromagnetic radiation as a probe. The course will introduce the physical principles of its interaction with matter, alongside useful practical considerations for measurement and analysis.The course assumes basic knowledge of optics, electromagnetism and electrodynamics (Experimental and Theoretical Physics II), quantum mechanics (Experimental and Theoretical Physics III), and condensed matter physics (Experimental Physics IV).The modules WPF 4 "Advanced Materials" and WPF 5 "Nanotechnology" or the laboratory practical course WLP4 in the Bachelor's program in Physics provide supplementary knowledge and skills.
Assessment and permitted materials
Written module exam in presence.A calculator and a single one-sided A4 sheet of handwritten notes is allowed.
Minimum requirements and assessment criteria
To pass the exam, basic physical understanding of the microscopy and spectroscopy needs to be demonstrated. The grade will depend on the depth and accuracy of the answers to the questions and follow-up questions.Scoring and grading will follow standard Austrian university grading practice (maximum points are 80):from 70: grade 1
from 60: grade 2
from 50: grade 3
from 40: grade 4
less than 40: grade 5
from 60: grade 2
from 50: grade 3
from 40: grade 4
less than 40: grade 5
Examination topics
The course is to be regarded as one, single and inseparable entity together with the associated exercise class 260073-1 PUE, which is listed separately for technical reasons only. What we show in class will be worked upon and truly learned by individual and independent work on the homework sets of 260073-1 PUE, which will be distributed weekly.If you attend the class, read the literature and do the homework problems, you will have commanded sufficient knowledge of the exam contents -- knowledge meaning that you will then be able to confront and solve physical problems at the level of those given at the homework assignments.For students in the new Master's Curriculum: No exams exist on exercise classes and no separate note will be given, since the class and the exercises are conceived as one entity ("module"). Accordingly, there will be just an exam of the whole Course.
Reading list
Transmission electron microscopy: a textbook for materials science
David B. Williams, Barry C. Carter
Springer, 2. Auflage (2009)Solid-State Spectroscopy: An Introduction
Hans Kuzmany
Springer, 2. Auflage (2009)Transmission Electron Microscopy and Diffractometry of Materials
Brent Fulz & James Howe
Springer, 4. Auflage (2014)
David B. Williams, Barry C. Carter
Springer, 2. Auflage (2009)Solid-State Spectroscopy: An Introduction
Hans Kuzmany
Springer, 2. Auflage (2009)Transmission Electron Microscopy and Diffractometry of Materials
Brent Fulz & James Howe
Springer, 4. Auflage (2014)
Association in the course directory
M-CORE 11, M-VAF A 1, UF MA PHYS 01a, UF MA PHYS 01b
Last modified: We 28.02.2024 14:46