260086 VO Introduction into Electron Microscopy II (2013S)
Labels
Voraussichtlich Montag und Dienstag, jeweils 10:15 - 11:00, Josef-Stefan-Hörsaal, Strudlhofgasse 4, 3. Stk., 1090 Wien.Vorbesprechung und 1. Vorlesung MO 04.03.2013
Details
Language: German
Examination dates
Tuesday
18.06.2013
Thursday
11.07.2013
Monday
15.07.2013
Monday
22.07.2013
Thursday
09.01.2014
Monday
10.03.2014
Monday
15.06.2015
Lecturers
Classes
Currently no class schedule is known.
Information
Aims, contents and method of the course
Fields of applications and methods of electron microscopical investigations, electron optics of the microscops, matter waves, electron diffraction and images of crystal structures, quantum interferometry with the electron microscope, demonstration of all electron microscopes of the Faculty of Physics during operation.
Assessment and permitted materials
Oral examination
Minimum requirements and assessment criteria
Electron microscopical investigations are not only used in materials physics but are also of great importance in nanotechnology, biology and medicine. The aim is to understand the scientific background of the electron microscopical methods with a specific focus on quantum interferometry with the electron microscope.
Examination topics
Lecture, discussions, demonstration of the microscopes
Reading list
D. B. Williams, C. B. Carter, Transmission Electron Microscopy (Plenum Press)
B. Fultz and J. Howe, Transmission Electron Microscopy and Diffractometry of Materials (Springer)
L. Reimer, Transmission Electron Microscopy (Springer)
M. De Graef, Conventional Transmission Electron Microscopy (Cambridge Univ. Press)
B. Fultz and J. Howe, Transmission Electron Microscopy and Diffractometry of Materials (Springer)
L. Reimer, Transmission Electron Microscopy (Springer)
M. De Graef, Conventional Transmission Electron Microscopy (Cambridge Univ. Press)
Association in the course directory
MF 2, MF 4, MaG 6, MaG 9, MaG 13,LA-Ph212(3)
Last modified: We 19.08.2020 08:06