Universität Wien FIND
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260086 VO Introduction into Electron Microscopy II (2013S)

2.50 ECTS (2.00 SWS), SPL 26 - Physik

Voraussichtlich Montag und Dienstag, jeweils 10:15 - 11:00, Josef-Stefan-Hörsaal, Strudlhofgasse 4, 3. Stk., 1090 Wien.

Vorbesprechung und 1. Vorlesung MO 04.03.2013

Details


Information

Aims, contents and method of the course

Fields of applications and methods of electron microscopical investigations, electron optics of the microscops, matter waves, electron diffraction and images of crystal structures, quantum interferometry with the electron microscope, demonstration of all electron microscopes of the Faculty of Physics during operation.

Assessment and permitted materials

Oral examination

Minimum requirements and assessment criteria

Electron microscopical investigations are not only used in materials physics but are also of great importance in nanotechnology, biology and medicine. The aim is to understand the scientific background of the electron microscopical methods with a specific focus on quantum interferometry with the electron microscope.

Examination topics

Lecture, discussions, demonstration of the microscopes

Reading list

D. B. Williams, C. B. Carter, Transmission Electron Microscopy (Plenum Press)
B. Fultz and J. Howe, Transmission Electron Microscopy and Diffractometry of Materials (Springer)
L. Reimer, Transmission Electron Microscopy (Springer)
M. De Graef, Conventional Transmission Electron Microscopy (Cambridge Univ. Press)

Association in the course directory

MF 2, MF 4, MaG 6, MaG 9, MaG 13,LA-Ph212(3)

Last modified: We 19.08.2020 08:06