Universität Wien

260105 SE Electron microscopical methods (TEM) (2008S)

5.00 ECTS (3.00 SWS), SPL 26 - Physik
Continuous assessment of course work

Details

Language: German

Lecturers

Classes (iCal) - next class is marked with N

  • Tuesday 04.03. 15:00 - 17:15 Büro
  • Tuesday 11.03. 15:00 - 17:15 Büro
  • Tuesday 18.03. 15:00 - 17:15 Büro
  • Tuesday 25.03. 15:00 - 17:15 Büro
  • Tuesday 01.04. 15:00 - 17:15 Büro
  • Tuesday 08.04. 15:00 - 17:15 Büro
  • Tuesday 15.04. 15:00 - 17:15 Büro
  • Tuesday 22.04. 15:00 - 17:15 Büro
  • Tuesday 29.04. 15:00 - 17:15 Büro
  • Tuesday 06.05. 15:00 - 17:15 Büro
  • Tuesday 13.05. 15:00 - 17:15 Büro
  • Tuesday 20.05. 15:00 - 17:15 Büro
  • Tuesday 27.05. 15:00 - 17:15 Büro
  • Tuesday 03.06. 15:00 - 17:15 Büro
  • Tuesday 10.06. 15:00 - 17:15 Büro
  • Tuesday 17.06. 15:00 - 17:15 Büro
  • Tuesday 24.06. 15:00 - 17:15 Büro

Information

Aims, contents and method of the course

Practical experience of using an electron microscope with selected examples (calibration of image rotation caused by the magnetic lenses, correlation between diffraction patterns and images of different materials).

Assessment and permitted materials

Minimum requirements and assessment criteria

It is the aim of this seminar/practical class to get personal experience in handling a transmission electron microscope, finding orientations in the reciprocal space and in understanding the physics of the information transfer in a TEM.

Examination topics

Practical training at the transmission electron microscope.

Reading list


Association in the course directory

PD251,310;LA-Ph71 freies Wahlfach

Last modified: Th 20.07.2023 00:20