260118 VO Ion Beam Analysis of Materials I (2007W)
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Di 12:15-13:45, VERA-SR, Institut f. Isotopenforschung u. Kernphysik, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Vorbesprechung: Di 2.10.2007 10:15
Vorbesprechung: Di 2.10.2007 10:15
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PD250,310;LA-Ph212(1),LA-Ph212(4),LA-Ph212(8)
Last modified: Fr 31.08.2018 08:55
Ion beam analysis (IBA) utilizes MeV ion beams to determine non-destructively the elemental composition of the near-surface region of solids (0-10 micrometer). Rutherford-backscattering (RBS), Elastic Recoil Detection Analysis (ERDA) and Particle Induced X-Ray Emission (PIXE) will be discussed in detail.