260118 VO Ion Beam Analysis of Materials I (2009W)

1.50 ECTS (1.00 SWS), SPL 26 - Physik

Vorbesprechung: Di 6.10.2009 12:30

Details

Language: German

Examination dates

Monday 19.11.2012 Friday 02.08.2013

Lecturers

Robin Golser

Classes (iCal) - next class is marked with N

    
    Tuesday
    06.10.
    12:30 - 14:00
    Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
    
    Tuesday
    13.10.
    12:30 - 14:00
    Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
    
    Tuesday
    20.10.
    12:30 - 14:00
    Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
    
    Tuesday
    27.10.
    12:30 - 14:00
    Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
    
    Tuesday
    03.11.
    12:30 - 14:00
    Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
    
    Tuesday
    10.11.
    12:30 - 14:00
    Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
    
    Tuesday
    17.11.
    12:30 - 14:00
    Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
    
    Tuesday
    24.11.
    12:30 - 14:00
    Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
    
    Tuesday
    01.12.
    12:30 - 14:00
    Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
    
    Tuesday
    15.12.
    12:30 - 14:00
    Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
    
    Tuesday
    12.01.
    12:30 - 14:00
    Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
    
    Tuesday
    19.01.
    12:30 - 14:00
    Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
    
    Tuesday
    26.01.
    12:30 - 14:00
    Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien

Information

Aims, contents and method of the course

Ion beam analysis (IBA) utilizes MeV ion beams to determine non-destructively the elemental composition of the near-surface region of solids (0-10 micrometer). Rutherford-backscattering (RBS), Elastic Recoil Detection Analysis (ERDA), Particle Induced X-Ray Emission (PIXE) and Particle Induced Gamma Emission (PIGE) will be discussed in detail.
Special emphasis is put on the analysis of precious objects of art.

Assessment and permitted materials

Oral exam

Minimum requirements and assessment criteria

Acquire knowledge in the field of "energetic atomic collisions", e.g. scattering and energy loss of charged particles in matter, excitation and ionization of atoms and molecules, emission of X-ray and Gamma radiation, detection of charged particles, detection of energetic electromagnetic radiation. Acquire knowledge in the field of "Materials analysis", e.g. qualitative and quantitative measurement of elemental composition, depth-resolved analysis, experimental setups.

Examination topics

Lecturing to present new knowledge, inquiry and discussion to assess previous knowledge, review of scientific papers to introduce applications, experimental demonstrations.

Reading list

Kopien wissenschaftlicher Arbeiten aus Fachzeitschriften

Association in the course directory

PD250,310;LA-Ph212(1)(4)

Last modified: Mo 07.09.2020 15:41