260140 VO Ion beam analysis of materials (2012S)

2.50 ECTS (2.00 SWS), SPL 26 - Physik

TERMINFESTLEGUNG: DI 06.03.2012 12.00-13.00 Ort: Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien;

DI wtl von 13.03.2012 bis 26.06.2012 12.15-13.45 Ort: Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien

Details

Language: German

Examination dates

Lecturers

Robin Golser

Classes

Currently no class schedule is known.

Information

Aims, contents and method of the course

Ion beam analysis (IBA) utilizes MeV ion beams to determine non-destructively the elemental composition of the near-surface region of solids (0-1 micrometer). Rutherford-backscattering (RBS), Elastic Recoil Detection Analysis (ERDA), Particle Induced X-Ray Emission (PIXE) and Particle Induced Gamma Emission (PIGE) will be discussed in detail.

Special emphasis is put on the analysis of precious objects of art.

Assessment and permitted materials

Oral exam

Minimum requirements and assessment criteria

Acquire knowledge in the field of "energetic atomic collisions", e.g. scattering and energy loss of charged particles in matter, excitation and ionization of atoms and molecules, emission of X-ray and Gamma radiation, detection of charged particles, detection of energetic electromagnetic radiation. Acquire knowledge in the field of "Materials analysis", e.g. qualitative and quantitative measurement of elemental composition, depth-resolved analysis, experimental setups.

Examination topics

Lecturing to present new knowledge, inquiry and discussion to assess previous knowledge, review of scientific papers to introduce applications, experimental demonstrations.

Reading list

Kopien wissenschaftlicher Arbeiten aus Fachzeitschriften

Association in the course directory

MaG 12, MaV 2, MaV 3, PD250, PD310, LA-Ph212(1), LA-Ph212(4), Dok4., Dok 5., Dok 7.

Last modified: We 19.08.2020 08:06