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260149 SE Structure analysis by interferometry of matter waves (2012S)
newest research developments
Continuous assessment of course work
Labels
persönliche Anmeldung per e-mail bei: jannik.meyer@univie.ac.at bis 1.3.2012
Details
max. 8 participants
Language: German
Lecturers
Classes
Currently no class schedule is known.
Information
Aims, contents and method of the course
New developments in structure analysis based on diffraction, scattering and interferometry of matter waves. Topics include: Approaches to solve the phase problem in diffraction data (ptychography, oversampling), methods for a direct imaging of structure, correction of lens aberrations in charged particle optics, approaches to reduce radiation damage, statistical approaches to extract information from large noisy data sets.
Assessment and permitted materials
Presentation by seminar participant and discussion.
Minimum requirements and assessment criteria
Understanding of the basic physical principles and the mathematical background of image formation from the scattering of electrons, neutrons, photons or other particles, by an insight into the current research.
Examination topics
Presentations by the seminar participants (with help during the preparation) and subsequent discussion.
Reading list
John C. H. Spence, High-resolution electron microscopy, Oxford University Press (2009).
J. Miao, T. Ishikawa, T. Earnest and Qun Shen, Extending the Methodology of X-ray Crystallography to Allow Structure Determination of Non-Crystalline Materials, Whole Cells and Single Macromolecular Complexes (Review), Annu. Rev. Phys. Chem 59, 387-409 (2008).
J. M. Rodenburg et al., Hard-X-Ray Lensless Imaging of Extended ObjectsPhys. Rev. Lett. 98, 034801 (2007).
J. Frank, Three-dimensional electron microscopy, Oxford University Press (2006)
P. Schwander, D. Giannakis, A. Ourmazd et al., The Symmetries of Image Formation by Scattering, Arxiv:1009.5035 und arXiv:1109.5286.
J. Miao, T. Ishikawa, T. Earnest and Qun Shen, Extending the Methodology of X-ray Crystallography to Allow Structure Determination of Non-Crystalline Materials, Whole Cells and Single Macromolecular Complexes (Review), Annu. Rev. Phys. Chem 59, 387-409 (2008).
J. M. Rodenburg et al., Hard-X-Ray Lensless Imaging of Extended ObjectsPhys. Rev. Lett. 98, 034801 (2007).
J. Frank, Three-dimensional electron microscopy, Oxford University Press (2006)
P. Schwander, D. Giannakis, A. Ourmazd et al., The Symmetries of Image Formation by Scattering, Arxiv:1009.5035 und arXiv:1109.5286.
Association in the course directory
MaG 14, MaV 3, PD310, PD251
Last modified: Fr 31.08.2018 08:55