Universität Wien FIND
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260195 VO Ion beam analysis of materials II (2008S)

2.50 ECTS (2.00 SWS), SPL 26 - Physik

Vorbesprechung: Di 4.3.2008 12:15 VERA-SR

Details

Language: German

Lecturers

Classes (iCal) - next class is marked with N

Tuesday 04.03. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 11.03. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 18.03. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 25.03. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 01.04. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 08.04. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 15.04. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 22.04. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 29.04. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 06.05. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 13.05. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 20.05. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 27.05. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 03.06. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 10.06. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 17.06. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
Tuesday 24.06. 12:15 - 13:45 Victor-Franz-Hess-Hörsaal, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien

Information

Aims, contents and method of the course

Ion beam analysis (IBA) utilizes MeV ion beams to determine non-destructively the elemental composition of the near-surface region of solids (0-1 micrometer). Rutherford-backscattering (RBS), Elastic Recoil Detection Analysis (ERDA), Particle Induced X-Ray Emission (PIXE) and Particle Induced Gamma Emission (PIGE) will be discussed in detail.
Special emphasis is put on the analysis of precious objects of art.

Assessment and permitted materials

Minimum requirements and assessment criteria

Acquire knowledge in the field of "energetic atomic collisions", e.g. scattering and energy loss of charged particles in matter, excitation and ionization of atoms and molecules, emission of X-ray and Gamma radiation, detection of charged particles, detection of energetic electromagnetic radiation. Acquire knowledge in the field of "Materials analysis", e.g. qualitative and quantitative measurement of elemental composition, depth-resolved analysis, experimental setups.

Examination topics

Lecturing to present new knowledge, inquiry and discussion to assess previous knowledge, review of scientific papers to introduce applications, experimental demonstrations.

Reading list

Kopien wissenschaftlicher Arbeiten aus Fachzeitschriften

Association in the course directory

PD250,310;LA-Ph212(1),LA-Ph212(4)

Last modified: Fr 31.08.2018 08:55