Universität Wien
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260203 VO Introduction into Electron Microscopy I (2012W)

2.50 ECTS (2.00 SWS), SPL 26 - Physik

Voraussichtlich: MO,DI, 10.00-10.45, Josef-Stefan-Hörsaal, Strudlhofgasse 4, 3. Stk., 1090 Wien

Vorbesprechung: 01.10.2012,10:00 Uhr, Josef-Stefan-HS


Language: German

Examination dates



Currently no class schedule is known.


Aims, contents and method of the course

Fields of applications and methods of electron microscopical investigations, electron optics of the microscops, matter waves, electron diffraction and images of crystal structures, demonstration of all two electron microscopes of the Faculty of Physics during operation. Matter waves life.

Assessment and permitted materials

Oral exam

Minimum requirements and assessment criteria

Matter waves in a quantum interferometer. Electron microscopical investigations are not only used in materials physics but are also of great importance in biology and medicine. The aim is to understand the scientific background of the electron microscopical methods.

Examination topics

The content of the lecture is structured systematically according to the concepts of physics and illustrated by examples and illustrations in a clear way.

Reading list

D. B. Williams, C. B. Carter, Transmission Electron Microscopy.
L. Reimer, Transmission Electron Microscopy.
M. De Graef, Conventional Transmission Electron Microscopy.
B. Fultz and J. Howe, Transmission Electron Microscopy and Diffraction of Materials.

Association in the course directory

MF 2, MF 4, MaG 6, MaG 9, MaG 13, PD250, LA-Ph212(3)

Last modified: We 19.08.2020 08:06