Universität Wien

270084 PR Practice in Tunnelling Microscopy (2018W)

3.00 ECTS (3.00 SWS), SPL 27 - Chemie
Continuous assessment of course work

Registration/Deregistration

Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).

Details

max. 6 participants
Language: German

Lecturers

Classes

Currently no class schedule is known.

Information

Aims, contents and method of the course

Scanning-Tunnelling Microscopy (STM), Atomic Force Microscopy (AFM)

Assessment and permitted materials

Evaluation: experimental work, quality of protocols, final presentation in group seminar.
Your practical work contributes to 50% of the overall score, the protocol 25% and the seminar lecture 25%. You have to reach 75% to pass.

Minimum requirements and assessment criteria

Practical course in tunnelling microscopy. Samples are partly dedicated to this course; partly they come from research activities of the group. The concrete experiments during your lab hence depend on the respective topic. Techniques also encompass imaging from force-distance-curves (for instance Peak Force QNM).

Examination topics

Independent measuring within the group after training on the equipment.

Reading list


Association in the course directory

AN-4, A.5

Last modified: Tu 27.11.2018 14:48