Universität Wien

270090 VO Spectroscopy of interfacial layers (2008W)

Analysis and spectroscopy of interfacial layers

1.50 ECTS (1.00 SWS), SPL 27 - Chemie

Di, 9.15 - 10.00 Uhr, Seminarraum d. Instituts f. Analytische Chemie
Beginn: 07.10.2008

Details

Language: German

Examination dates

Lecturers

Classes

Currently no class schedule is known.

Information

Aims, contents and method of the course

F212: elective field of concentration in analytical chemistry and matter chemistry
Content: Interfacial layers have important electrical properties, serve in catalytic processes, chemical sensing, materials for separation technology, matter transport and selection and especially in biomembranes. Optical multi reflection methods, as well in the visible as in the infrared range, and ESCA, Auger- and electron loss spectroscopy and SIMS, but also Mößbauer spectroscopy permit a thorough analysis and structure elucidation of surfaces. New dimensions are revealed by scanning tunnelling microscopy, atomic force microscopy and scanning near field optical microscopy, which are capable of atomic resolution.

Assessment and permitted materials

Minimum requirements and assessment criteria

Importance and chemical analysis of interfacial layers

Examination topics

Evaluation: oral examination

Reading list

Lernbehelfe: Skriptum des Vortragenden

Association in the course directory

AN-4

Last modified: We 19.08.2020 08:06