270159 VO Characterization of Materials (2013W)

(Kautek) Fundamentals of Optical and Electron Microscopy, Bright and Dark Field Techniques, Phase and Interference Contrast, Fluorescence Microscopy, Fluorescence Resonance Energy Transfer (FRET), Confocal Microscopy, Nonlinear Optics - Multiphoton Fluorescence Microscopy, Second Harmonic Generation at Interfaces, Laser-Induced Breakdown Spectroscopy (LIBS), Scanning Tunneling Microscopy (STM), Scanning Force Microscopy (SFM), Optical Nearfield (Fundamentals), Aperture Scanning Nonlinear Optical Microscopy (SNOM), Scattering SNOM, Apertureless SNOM, fs-SNOM, Total Internal Reflection Fluorescence (TIRF), Voltammetry of Microparticles (VMP), Electrochemical Quartz Microbalance (EQMB), In-situ Grazing Incidence X-Ray Diffractometry (GIXD), Electrochemical Nanotribology, Electrochemical Laser Activation/Depassivation, Scanning Electrochemical Microscopy (SECM)
(Rupprechter) Infrared-Reflection-Absorption-Spectroscopy (IRAS), Raman Spectroscopy (SERS), X-ray and UV Photoelectron Spectroscopy, Auger Spectroscopy, Microspectroscopy and Spectromicroscopy, X-ray Absorption Spectroscopy (EXAFS), X-Ray Diffraction (XRD), Low-Energy-Electron-Diffraction (LEED), Transmission-Electron-Diffraction (TED), Transmission- and Scanning Electron Microscopy, Analytical Electron Microscopy (SAED, EDX, EELS)