Universität Wien FIND
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270266 VO Modern methods for materials characterization (2010W)

4.00 ECTS (3.00 SWS), SPL 27 - Chemie

on Tuesdays, time and location to be defined

Begin: 12.10.2010


Language: German, English

Examination dates



Currently no class schedule is known.


Aims, contents and method of the course

Optical microscopy: bright & dark field, phase & interference contrast. Fluorescence microscopy: light sources, fluorescence detectors, digital image, objectives. Single- & two-photon confocal microscopy: basic idea & differences, advantages & disadvantages. Optical Nearfield Microscopy: SNOM, a-SNOM. Scanning Probe Microscopy. Optimal technique for specific applications.

Assessment and permitted materials

Written exam

Minimum requirements and assessment criteria

Insight and competence in modern methods for materials characterization.

Examination topics

Interactive lecture

Reading list

Lecture notes and original literature

Association in the course directory


Last modified: We 19.08.2020 08:06