270284 UE Modern Techniques for Materials' Characterization (2019S)

Continuous assessment of course work

Registration/Deregistration

Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).

Registration is open from Fr 01.02.2019 08:00 to Su 30.06.2019 23:59
Deregistration possible until Su 30.06.2019 23:59

Details

max. 15 participants

Language: German

Lecturers

Classes

Vorbesprechung am 8. März 13:00 Seminarraum 4 im Halbstock (Physikalische Chemie)

Information

Aims, contents and method of the course

A small research project intends to provide an introduction into
(a) the techniques and interpretation of powder diffraction data (XPD, Rietveld analysis) or
(b) to the ab-initio determination of an unknown crystal structure from X-ray single crystal data or
(c) determination of a part of a phase diagram via EPMA, DTA, XPD

Assessment and permitted materials

Minimum requirements and assessment criteria

Examination topics

Reading list

Association in the course directory

PC-1, B.2, Doktorat

Last modified: Mo 07.09.2020 15:42