280085 UE MA-ERD-17.2 Field emission scanning electron microscopy and ion beam applications (PI) (2014W)
Continuous assessment of course work
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preliminary meeting Thu 16.10.2014. 11:30, Raum 2A478
lecture date:
13.2.2015, 9:30-12:00 and 13:15-14:45 (t.b.a.)
16.-20.2.2015, daily 9:15-12:15 and 13:30-16:30 (room 2U120)
lecture date:
13.2.2015, 9:30-12:00 and 13:15-14:45 (t.b.a.)
16.-20.2.2015, daily 9:15-12:15 and 13:30-16:30 (room 2U120)
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from Fr 19.09.2014 00:00 to Fr 17.10.2014 23:59
- Deregistration possible until Fr 17.10.2014 23:59
Details
max. 10 participants
Language: German
Lecturers
Classes
Currently no class schedule is known.
Information
Aims, contents and method of the course
Assessment and permitted materials
Minimum requirements and assessment criteria
Examination topics
Reading list
Association in the course directory
Last modified: Mo 07.09.2020 15:42