Universität Wien

280085 UE MA-ERD-17.2 Field emission scanning electron microscopy and ion beam applications (PI) (2014W)

Continuous assessment of course work

preliminary meeting Thu 16.10.2014. 11:30, Raum 2A478
lecture date:
13.2.2015, 9:30-12:00 and 13:15-14:45 (t.b.a.)
16.-20.2.2015, daily 9:15-12:15 and 13:30-16:30 (room 2U120)

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Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).

Details

max. 10 participants
Language: German

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Last modified: Mo 07.09.2020 15:42