280085 UE MA-ERD-17.2 Field emission scanning electron microscopy and ion beam applications (PI) (2015W)
Continuous assessment of course work
Labels
Basic knowledge of Scanning Electron Microscopy is required ("MA-ERD-2 Instrumentelle Analytik in den Geowissenschaften" or certificate of equivalent education)
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from Mo 14.09.2015 10:00 to Mo 28.09.2015 23:59
- Registration is open from Mo 05.10.2015 10:00 to Mo 19.10.2015 23:59
- Deregistration possible until Mo 19.10.2015 23:59
Details
max. 10 participants
Language: German
Lecturers
Classes (iCal) - next class is marked with N
Block course in February 2016 (presumably 12.-19. February 2016. Dates will be scheduled at the preliminary meeting)
Dates and schedule: see announcements at the Department for Lithospheric Research!
Tuesday
13.10.
16:00 - 16:45
Hörsaal 1 2A120 1.OG UZA II Geo-Zentrum
(Kickoff Class)
Friday
13.11.
12:30 - 16:45
Friedrich Becke Seminarraum 2C315 3.OG UZA II
Information
Aims, contents and method of the course
Assessment and permitted materials
Permanent attendance during the practicals is required for a positive certificate.
During the practicals every student independently collects an SE- and BSE-image after setting the required electron beam parameters (UE SEM) and generates a cross-section using the focused ion beam (UE FIB).
Assessment criterion: Written workflow protocol of the practicals (max 48 scores); UE SEM (max 26 scores); UE FIB (max 26 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
(Submission of the workflow protocol until 28. April 2016).
During the practicals every student independently collects an SE- and BSE-image after setting the required electron beam parameters (UE SEM) and generates a cross-section using the focused ion beam (UE FIB).
Assessment criterion: Written workflow protocol of the practicals (max 48 scores); UE SEM (max 26 scores); UE FIB (max 26 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
(Submission of the workflow protocol until 28. April 2016).
Minimum requirements and assessment criteria
Students are able to operate the FIB-SEM instrument for electron imaging at high spatial resolution and for FIB applications. They know the special instrumental features of the FIB-SEM instrument in theory and practice. The students learn to collect electron optical images using different detectors (SED, BSED, FSD, STEM) and to perform cross-sections using FIB. Furthermore, the students are introduced to the analytical basics of EBSD- and EDX-analysis. They are able to use the different methods of microstructure analysis for working at individual questions in geomaterials research.
Examination topics
theoretical introduction: lecture;
practicals: Demonstration, and individual work under supervision at the Quanta 3D FEG instrument
practicals: Demonstration, and individual work under supervision at the Quanta 3D FEG instrument
Reading list
Association in the course directory
Last modified: Sa 02.04.2022 00:25
practicals at the Quanta 3D FEG instrument: Hardware; Software; sample exchange; Secondary Electron and Back Scattered Electron imaging; STEM imaging; EDX; FIB; Gas injection systems; micromanipulator; EBSD; FSD