280085 UE MA-ERD-17.2 Field emission scanning electron microscopy and ion beam applications (PI) (2016W)
Continuous assessment of course work
Labels
Preliminary meeting (compulsory) Tue 11.10.2016, 15:00-16:00, 2C315Students, who are absent during the preliminary meeting will be unsubscribed.Block course 17.2. - 24.2.2017Basic knowledge of Scanning Electron Microscopy is required ("MA-ERD-2 Instrumentelle Analytik in den Geowissenschaften" or certificate of equivalent education)
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from We 14.09.2016 10:00 to We 28.09.2016 23:59
- Registration is open from We 05.10.2016 10:00 to We 19.10.2016 23:59
- Deregistration possible until We 19.10.2016 23:59
Details
max. 10 participants
Language: German, English
Lecturers
Classes (iCal) - next class is marked with N
Schedule may change according to agreement with the participants during the preliminary meeting at 11. October 2016
- Tuesday 11.10. 15:00 - 16:00 Friedrich Becke Seminarraum 2C315 3.OG UZA II (Kickoff Class)
- Friday 17.02. 09:30 - 12:00 Friedrich Becke Seminarraum 2C315 3.OG UZA II
- Friday 17.02. 13:30 - 14:45 Friedrich Becke Seminarraum 2C315 3.OG UZA II
Information
Aims, contents and method of the course
Assessment and permitted materials
Permanent attendance during the practicals is required for a positive certificate.
During the practicals every student independently collects an SE- and BSE-image after setting the required electron beam parameters (UE SEM) and generates a cross-section using the focused ion beam (UE FIB).
Assessment criterion: Written workflow protocol of the practicals (max 60 scores); UE SEM (max 20 scores); UE FIB (max 20 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
(Submission of the workflow protocol until 19. April 2017).
During the practicals every student independently collects an SE- and BSE-image after setting the required electron beam parameters (UE SEM) and generates a cross-section using the focused ion beam (UE FIB).
Assessment criterion: Written workflow protocol of the practicals (max 60 scores); UE SEM (max 20 scores); UE FIB (max 20 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
(Submission of the workflow protocol until 19. April 2017).
Minimum requirements and assessment criteria
Permanent attendance during the practicals is required for a positive certificate.
Assessment criterion: Written workflow protocol of the practicals (max 60 scores); UE SEM (max 20 scores); UE FIB (max 20 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
(Submission of the workflow protocol until 19. April 2017).
Assessment criterion: Written workflow protocol of the practicals (max 60 scores); UE SEM (max 20 scores); UE FIB (max 20 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
(Submission of the workflow protocol until 19. April 2017).
Examination topics
practicals: individual work under supervision at the Quanta 3D FEG instrument.
Written Workflow-protocol covering the practical parts (SE- BSE-imaging; Generating a cross section using the focused ion beam)
Written Workflow-protocol covering the practical parts (SE- BSE-imaging; Generating a cross section using the focused ion beam)
Reading list
Association in the course directory
Last modified: Sa 02.04.2022 00:25
Students are able to operate the FIB-SEM instrument for electron imaging at high spatial resolution and for FIB applications. They know the special instrumental features of the FIB-SEM instrument in theory and practice. The students learn to collect electron optical images using different detectors (SED, BSED, FSD, STEM) and to perform cross-sections using FIB. Furthermore, the students are introduced to the analytical basics of EBSD- and EDX-analysis. They are able to use the different methods of microstructure analysis for working at individual questions in geomaterials research.Content:
theoretical introduction: Special features of the Quanta 3D FEG instrument (E-gun and E-column, FIB, detectors)
practicals at the Quanta 3D FEG instrument: Hardware; Software; sample exchange; Secondary Electron and Back Scattered Electron imaging; STEM imaging; EDX; FIB; Gas injection systems; micromanipulator; EBSD; FSD