280121 UE Scanning Electron Microscopy (2025S)
Continuous assessment of course work
Labels
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from Mo 03.02.2025 08:00 to Mo 24.02.2025 23:59
- Registration is open from We 26.02.2025 00:00 to Su 09.03.2025 23:59
- Deregistration possible until Mo 31.03.2025 23:59
Details
max. 10 participants
Language: German
Lecturers
Classes
Preliminary meeting: Friday, 28.03.202 um 16:00 in HS 2A225
Course: 14. - 17.4. & 22. - 25.4. 2025 (Easter holidays) von ca. 9:00 - 18:00 room: 2U 119
Information
Aims, contents and method of the course
Students have received a practice-oriented introduction to scanning electron microscopy and are familiar with the possible applications of this method for working on earth science issues. Students are proficient in working in high- and low-vacuum mode and can independently take electron-optical images using secondary and backscattered electron detectors. Students are also familiar with the practical application of energy-dispersive X-ray microanalysis. They are able to operate the device independently and use it to work on their own problems.Translated with DeepL.com (free version)
Assessment and permitted materials
Controlled compulsory attendance and active participation in the exercises (coordinated with the specified current Covid-19 safety measures for classroom teaching)
Minimum requirements and assessment criteria
Module grade: Practical partial performance and writing of a work report
Examination topics
Applied basics of electron microscopy (working in high and low vacuum mode and EDX analysis)
Reading list
Basic literature online or further literature for interested students
Association in the course directory
MA-ERD-W-3.2
Last modified: Fr 21.02.2025 15:07