280127 UE Field Emission Scanning Electron Microscopy and Ion Beam Applications (2025S)
Continuous assessment of course work
Labels
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from We 26.03.2025 00:00 to Tu 29.04.2025 23:59
- Deregistration possible until Sa 31.05.2025 23:59
Details
max. 10 participants
Language: German, English
Lecturers
Classes (iCal) - next class is marked with N
The course will be held as block course on site on 18.-25 August 2025.
- N Monday 18.08. 09:30 - 12:00 Seminarraum Paläontologie 2B311 3.OG UZA II
- Monday 18.08. 13:15 - 14:30 Seminarraum Paläontologie 2B311 3.OG UZA II
Information
Aims, contents and method of the course
Assessment and permitted materials
Attendance during the practicals is required for a positive certificate.
During the practicals every student independently collects SE- and BSE-images after setting the required electron beam parameters (UE SEM) and generates a cross-section using the focused ion beam (UE FIB).
Assessment criteria: active participation during the practicals; originally composed workflow protocol of all parts of the practicals.
Submission of the workflow protocol until 14. September 2025.
During the practicals every student independently collects SE- and BSE-images after setting the required electron beam parameters (UE SEM) and generates a cross-section using the focused ion beam (UE FIB).
Assessment criteria: active participation during the practicals; originally composed workflow protocol of all parts of the practicals.
Submission of the workflow protocol until 14. September 2025.
Minimum requirements and assessment criteria
Permanent attendance of the practicals is required for a positive certificate.
Assessment criteria:
- active participation during the practicals: UE SEM (max 20 scores); UE FIB (max 20 scores)
- originally composed workflow protocol of the practicals (max 60 scores). Submission of the workflow protocol until 14. September 2025The received scores for the practical parts and the workflow protocol will be summed up.
Total scores for positive degree: maximum 100 scores, minimum 50 scoresRating:
100-89 points (grade 1)
88-76 points (grade 2)
75-63 points (grade 3)
62-50 points (grade 4)
49-0 points (grade 5)
Assessment criteria:
- active participation during the practicals: UE SEM (max 20 scores); UE FIB (max 20 scores)
- originally composed workflow protocol of the practicals (max 60 scores). Submission of the workflow protocol until 14. September 2025The received scores for the practical parts and the workflow protocol will be summed up.
Total scores for positive degree: maximum 100 scores, minimum 50 scoresRating:
100-89 points (grade 1)
88-76 points (grade 2)
75-63 points (grade 3)
62-50 points (grade 4)
49-0 points (grade 5)
Examination topics
Individual work under supervision at the Quanta 3D FEG instrument during practicals.
Original composition of a workflow-protocol covering all parts of the practicals.
Original composition of a workflow-protocol covering all parts of the practicals.
Reading list
Association in the course directory
MA-ERD-W3.3
Last modified: Tu 25.03.2025 19:46
Students have become acquainted with the special instrumental features of field emission scanning electron microscopy in theory and in practice, and are familiar with focused ion beam (FIB) applications. The students collect electron optical images at high spatial resolution using various detectors (SED, BSED, FSD, STEM) and learn to generate cross-sections using FIB. Furthermore, the students have received insight into the practical application of the EBSD method. They are able to use the different methods of microstructure and texture analysis at high spatial resolution for working at individual questions in geomaterials research.Content:
theoretical introduction: Special features of the Quanta 3D FEG instrument (E-gun and E-column, FIB, detectors)
practicals at the Quanta 3D FEG instrument: Hardware; Software; sample exchange; Secondary Electron and Back Scattered Electron imaging; STEM imaging; EDX; FIB; Gas injection systems; usage of the micromanipulator; EBSD; FSD