Universität Wien FIND
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300218 UE Scanning electron microscopy - techniques and preparations for biologists (2019S)

5.00 ECTS (3.00 SWS), SPL 30 - Biologie
Continuous assessment of course work

Details

max. 6 participants
Language: German, English

Lecturers

Classes (iCal) - next class is marked with N

ATTENTION: No online registration possible.

Personal registration and agreement on the subject of the course not later than 21.02.2019: daniela.gruber@univie.ac.at, room 1032, level 1.

The final allocation will take place on Monday, 01.03.2019 punctually at 8:15 am directly before the obligatory safety instruction!

Maximum number of participants: 6

Program:
Final allocation and safety instruction: Friday 01.03.2019 08:15 - 10:00 Conference room Zoology, UZA 1, Biozentrum Althanstraße 14, 1.015 EG 1.015

Introductory short lectures of the students and theory: Monday 04.03.2019 08:15 - 15:00 Conference Room of Zoology, UZA 1, Biozentrum Althanstraße 14, 1.015 EG 1.015
Final meeting and short presentations: Wednesday 13.03.2019 08:15 - 13:00 Conference Room of Zoology, UZA 1, Biozentrum Althanstraße 14, 1.015 EG 1.015

Practical part:
DI 05.03.2019 - DI 12.03.2019 from 8:15 - 3:00 pm in the EM Laboratory, Cell Imaging and Ultrastructure Research, UZA 1, Biozentrum Althanstraße 14, 1090 Wien. 1 . level

Friday 01.03. 08:00 - 10:00 Konferenzraum der Zoologie, UZA 1,Biozentrum Althanstraße 14, 1.015 EG
Monday 04.03. 08:15 - 15:00 Konferenzraum der Zoologie, UZA 1,Biozentrum Althanstraße 14, 1.015 EG
Wednesday 13.03. 08:15 - 13:00 Konferenzraum der Zoologie, UZA 1,Biozentrum Althanstraße 14, 1.015 EG

Information

Aims, contents and method of the course

This course is intended for those colleagues who are planning to use one of the Scanning Electron Microscopes in the EM Lab(Core Facility Cell Imaging and Ultrastructure Research) as part of their Master Thesis or PhD work and who already have a specific research question and a sample to be worked on during the course.
After successful completion of the course, the corresponding equipment may be used immediately independently and on its own responsibility.
Participation in this course without a specific question and without sample material is only possible if there are still places available.

Contents and methods:
Our Scanning Electron Microscopes (SEM) offer various techniques to investigate samples.
In this course you will have the opportunity to learn the necessary preparation steps and the usage of the SEM in several modes so that you can apply these techniques with your own samples afterwards.
The following techniques will be offered for sample preparation:
Fixation (glutaraldehyde, OsO4), dehydration (Ethanol, Acetone, DMP), drying (critical point, chemical), coating with gold and carbon, cryopreparation.
On the SEM you will use the following modes:
Secondary electron detector in low vacuum and high vacuum, backscatter electron detector in low vacuum and high vacuum, energy dispersive x-ray micro analysis with EDX detector (demo), cryo transfer of deep frozen samples (DEMO)

Assessment and permitted materials

1) Short presentation (about 5 minutes): For which scientific question should the Scanning Electron Microscope be used? Presentation of the sample to be prepared and examined during the course (25%)
2) Cooperation (40%)
3) Short presentation (5 - 10 minutes): Which results were achieved? Where do possibilities arise to improve the results? What would a further experiment planning look like? (25%)
4) Protocol 10%

Every part has to be positive

Minimum requirements and assessment criteria

Choice of relevant methods for sample preparation, practical work in our chemlab, operating preparation instruments and SEM, evaluation and interpretation of results.

Examination topics

Theoretical background (lecture). Operating the preparation instruments and the SEM (practical work). Evaluation and interpretation of the results.

Reading list

Will be announced during the course.

Association in the course directory

MZO W-1, M-WZB, MAN 3, MEC-9, MBO 7, MZO 2

Last modified: Th 24.01.2019 10:48