300218 UE Scanning electron microscopy - techniques and preparations for biologists (2023S)
Continuous assessment of course work
Labels
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from Th 09.02.2023 08:00 to Th 23.02.2023 18:00
- Deregistration possible until We 15.03.2023 18:00
Details
max. 6 participants
Language: German, English
Lecturers
Classes (iCal) - next class is marked with N
Lecture: 03.03.2023, 08:00 - 14:45.
Practical Part: 06.03 - 16.03.2023, EM Lab 4. Floor, Rooms 4.075, 4.089, 4.090, from 08:00 - 14:00.
Final Meeting: 17.03.2023 9:45 - 13:00.
- Friday 03.03. 08:00 - 14:45 Seminarraum 1.3, Biologie Djerassiplatz 1, 1.005, Ebene 1
Information
Aims, contents and method of the course
Assessment and permitted materials
Choice of relevant methods for sample preparation, work in our chemlab, operating preparation instruments and SEM, evaluation and interpretation of results.
1) Moodle Test - Safety instructions for the EM Lab (has to be done before practical work)
2) Cooperation
3) Short Presentation
4) Worksheets
1) Moodle Test - Safety instructions for the EM Lab (has to be done before practical work)
2) Cooperation
3) Short Presentation
4) Worksheets
Minimum requirements and assessment criteria
Every part has to be positive
Safety instructions 25 points
Cooperation 25 points
Short presentation 25 points
Worksheets 25 points0 - 50 points 5
51 - 67 points 4
67 - 81 points 3
82 - 90 points 2
91 - 100 points 1
Safety instructions 25 points
Cooperation 25 points
Short presentation 25 points
Worksheets 25 points0 - 50 points 5
51 - 67 points 4
67 - 81 points 3
82 - 90 points 2
91 - 100 points 1
Examination topics
Theoretical background (lecture). Operating the preparation instruments and the SEM (practical work). Evaluation and interpretation of the results.
Reading list
Will be presented during the course.
Association in the course directory
M-WZB, MAN 3, MEC-9, MBO 7, MZO 2, MZO4, MZO2
Last modified: We 15.03.2023 12:09
Our Scanning Electron Microscopes (SEM) offer various techniques to investigate samples.
In this course you will have the opportunity to learn the necessary preparation steps and the usage of the SEM in several modes so that you can apply these techniques with your own samples afterwards.
On the SEM you will use the following modes:
Secondary electron detector in low vacuum and high vacuum, backscatter electron detector in low vacuum and high vacuum, energy dispersive x-ray micro analysis with EDX detector.