Universität Wien

300218 UE Scanning electron microscopy - techniques and preparations for biologists (2023W)

5.00 ECTS (3.00 SWS), SPL 30 - Biologie
Continuous assessment of course work

Registration/Deregistration

Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).

Details

max. 6 participants
Language: German, English

Lecturers

Classes (iCal) - next class is marked with N

20.11. Please confirm your participation by email
(if necessary, please deregister in time to give students on waiting list a chance to attend the course)
21.11. You will get the official link to the Moodle course "Safety Instructions for the Core Facility Cell Imaging and Ultrastructure Research". Please run the test of the Moodle course.
until 27.11. Please run the test of the Moodle course.

30.11. 08:00 – 12:00 Lecture part 1
01.12. 08:00 – 12:00 Lecture part 2

04.12. 08:00 – 14:00 Sample preparation

05.12. 08:00 – 14:00 Introduction SEM JEOL IT 300
06.12. 08:00 – 14:00 Introduction SEM Philips XL 30 ESEM
07.12. 08:00 – 14:00 Introduction Low Vac Mode and EDAX

11.12. 08:00 – 10:00 2 Timeslots for independent work on SEMs
11.12. 10:00 – 12:00 2 Timeslots for independent work on SEMs
12.12. 08:00 – 10:00 2 Timeslots for independent work on SEMs
12.12. 10:00 – 12:00 2 Timeslots for independent work on SEMs
13.12. 08:00 – 10:00 2 Timeslots for independent work on SEMs
13.12. 10:00 – 12:00 2 Timeslots for independent work on SEMs
At the beginning of the course, the timeslots can be booked in Moodle.
Please choose one slot for each of the two electron microscopes.

15.12. 09:00 – 12:00 Final Meeting and Presentations

  • Thursday 30.11. 08:00 - 13:00 Seminarraum 1.8, Biologie Djerassiplatz 1, 1.007, Ebene 1
  • Friday 01.12. 08:00 - 13:00 Seminarraum 1.8, Biologie Djerassiplatz 1, 1.007, Ebene 1
  • Friday 15.12. 08:00 - 11:15 Seminarraum 1.8, Biologie Djerassiplatz 1, 1.007, Ebene 1

Information

Aims, contents and method of the course

Contents and methods:
Our Scanning Electron Microscopes (SEM) offer various techniques to investigate samples.
In this course you will have the opportunity to learn the necessary preparation steps and the usage of the SEM in several modes so that you can apply these techniques with your own samples afterwards.
On the SEM you will use the following modes:
Secondary electron detector in low vacuum and high vacuum, backscatter electron detector in low vacuum and high vacuum, energy dispersive x-ray micro analysis with EDX detector.

Assessment and permitted materials

Choice of relevant methods for sample preparation, work in our chemlab, operating preparation instruments and SEM, evaluation and interpretation of results.
1) Moodle Test - Safety instructions for the EM Lab (has to be done before practical work)
2) Cooperation (mandatory attendance!!!)
3) Short Presentation
4) Worksheets

Minimum requirements and assessment criteria

Every part has to be positive
Safety instructions 25 points
Cooperation 25 points
Short presentation 25 points
Worksheets 25 points

0 - 50 points 5
51 - 67 points 4
67 - 81 points 3
82 - 90 points 2
91 - 100 points 1

Examination topics

Theoretical background (lecture). Operating the preparation instruments and the SEM (practical work). Evaluation and interpretation of the results.

Reading list

Will be presented during the course.

Association in the course directory

M-WZB, MAN 3, MEC-9, MBO 7, MZO2, MZO4

Last modified: Mo 27.11.2023 12:08