300218 UE Scanning electron microscopy - techniques and preparations for biologists (2024S)
Labels
Registration/Deregistration
- Registration is open from Th 08.02.2024 14:00 to Th 22.02.2024 18:00
- Deregistration possible until Fr 15.03.2024 18:00
Details
Lecturers
Classes (iCal) - next class is marked with N
Participation on all announced course units is mandatory!
04.03.2024_08:00 - 08:30. Online Meeting (preliminary meeting, final allocation of workspace).
till 07.03.2024: Moodle test Safety introduction CIUS (100%)
07.03.2024_08:00 - 12:00. Lecture part 1.
08.03.2024_08:00 - 12:00. Lecture part 2.
11:03.2024_08:00 - 14:00. Sample preparation.
13.03.2024_08:00 - 14:00. Introduction SEM JEOL IT 300.
14.03.2024_08:00 - 14:00. Introduction Low Vacuum, EDAX.
15.03.2024_08:00 - 12:00. Time slots for work on SEM.
18.03.2024_08:00 - 12:00. Time slots for work on SEM.
19.03.2024_08:00 - 12:00. Time slots for work on SEM.
20.03.2024_08:00 - 12:00. Time slots for work on SEM.
The time slots can be booked in Moodle.
Use the free time between slots to study the theory in more detail.
21.03.2024. Preparation of worksheets and PowerPoint short presentations (7-10min), repetition of the theoretical learning material
22.03.2024_08:00 - 12:00. Final meeting, short presentations. Discussion of theory.
- Thursday 07.03. 08:00 - 13:00 Seminarraum 1.1 PC, Biologie Djerassiplatz 1, 1.003, Ebene 1
- Friday 08.03. 08:00 - 13:00 Seminarraum 1.1 PC, Biologie Djerassiplatz 1, 1.003, Ebene 1
- Friday 22.03. 08:00 - 11:15 Seminarraum 1.1 PC, Biologie Djerassiplatz 1, 1.003, Ebene 1
Information
Aims, contents and method of the course
Assessment and permitted materials
1) Moodle Test - Safety instructions for the EM Lab (has to be done before practical work)
2) Cooperation
3) Short Presentation
4) Worksheets
Minimum requirements and assessment criteria
Safety instructions 25 points
Cooperation 25 points
Short presentation 25 points
Worksheets 25 points0 - 50 points 5
51 - 67 points 4
67 - 81 points 3
82 - 90 points 2
91 - 100 points 1
Our Scanning Electron Microscope (SEM) offer various techniques to investigate samples.
In this course you will have the opportunity to learn the necessary preparation steps and the usage of the SEM in several modes so that you can apply these techniques with your own samples afterwards.
On the SEM you will use the following modes:
Secondary electron detector in low vacuum and high vacuum, backscatter electron detector in low vacuum and high vacuum, energy dispersive x-ray micro analysis with EDX detector.