301901 VO+UE Introduction into 3D cryo electron microscopy (2024W)
Continuous assessment of course work
Labels
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from Th 12.09.2024 14:00 to Th 26.09.2024 18:00
- Deregistration possible until Th 26.09.2024 18:00
Details
max. 20 participants
Language: English
Lecturers
Classes (iCal) - next class is marked with N
see german version
- Wednesday 02.10. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
- Wednesday 09.10. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
- Wednesday 16.10. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
- Wednesday 23.10. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
- Wednesday 30.10. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
- Wednesday 06.11. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
- Wednesday 13.11. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
- Wednesday 20.11. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
- N Wednesday 27.11. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
- Wednesday 04.12. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
- Wednesday 11.12. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
- Wednesday 08.01. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
- Wednesday 15.01. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
- Wednesday 22.01. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
- Wednesday 29.01. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
Information
Aims, contents and method of the course
Mathematical Background Fourier Theory for 3D EM Correlation and Convolution Information theory for 3D EM Optics of the Transmission electron microscope The electron source The condenser system The objective and image generation within an electron microscope Electron detection Sample preparation Image processing Single particle 2D analysis Single particle 3D generation Single particle refinement and validation Tomographic processing Modern conceptsPracticals/Tutorials: Negative staining EM Cryo EM Tomographic acquisition Single particle image processing Tomographic image processing
Assessment and permitted materials
The evaluation consists of different performances: active participation and results obtained, theoretical knowledge including final exam.
Minimum requirements and assessment criteria
Compulsory attendance;A basic understanding of the concepts presented should be acquired.Active participation and results obtained, Theoretical knowledge (final exam);(The percentage of the subgrades will be announced by the course leader, each of the subgrades must have a positive evaluation.)
Examination topics
Content of the course units
Reading list
The lecturers will provide slides that gather the required material. Suggestions for further reading material will be provided during the lecture.
Association in the course directory
PhD (SPL 56), WZB, MMEI III, MMB IV., MNEU V.
Last modified: Fr 19.07.2024 11:06