Universität Wien
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301901 VO+UE Introduction into 3D cryo electron microscopy (2025W)

3.00 ECTS (2.00 SWS), SPL 30 - Biologie
Continuous assessment of course work
We 01.10. 13:00-14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien

Details

max. 20 participants
Language: English

Lecturers

Classes (iCal) - next class is marked with N

see german version

  • Wednesday 08.10. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
  • Wednesday 15.10. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
  • Wednesday 22.10. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
  • Wednesday 29.10. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
  • Wednesday 05.11. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
  • Wednesday 12.11. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
  • Wednesday 19.11. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
  • Wednesday 26.11. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
  • Wednesday 03.12. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
  • Wednesday 10.12. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
  • Wednesday 17.12. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
  • Wednesday 07.01. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
  • Wednesday 14.01. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
  • Wednesday 21.01. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien
  • Wednesday 28.01. 13:00 - 14:30 STB/Hörsaal A Campus Vienna Biocenter 5, 1030 Wien

Information

Aims, contents and method of the course

Mathematical Background Fourier Theory for 3D EM Correlation and Convolution Information theory for 3D EM Optics of the Transmission electron microscope The electron source The condenser system The objective and image generation within an electron microscope Electron detection Sample preparation Image processing Single particle 2D analysis Single particle 3D generation Single particle refinement and validation Tomographic processing Modern conceptsPracticals/Tutorials: Negative staining EM Cryo EM Tomographic acquisition Single particle image processing Tomographic image processing

Assessment and permitted materials

The evaluation consists of different performances: active participation and results obtained, theoretical knowledge including final exam.

Minimum requirements and assessment criteria

Compulsory attendance;A basic understanding of the concepts presented should be acquired.Active participation and results obtained, Theoretical knowledge (final exam);(The percentage of the subgrades will be announced by the course leader, each of the subgrades must have a positive evaluation.)

Examination topics

Content of the course units

Reading list

The lecturers will provide slides that gather the required material. Suggestions for further reading material will be provided during the lecture.

Association in the course directory

PhD (SPL 56), WZB, MMEI III, MMB IV., MNEU V.

Last modified: Fr 27.06.2025 00:02