806527 VO Ion Beam Analysis of Materials II (2005S)
Ion Beam Analysis of Materials II
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Beginn: Mo 4.4.2005, 10:30-12:00, VERA-SR, Institut für Isotopenforschung und Kernphysik, Währinger Str. 17, Hoftrakt, 1090 Wien.
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PD250,310;P251d;LA-Ph212(1)
Last modified: Fr 31.08.2018 09:01
Ion beam analysis (IBA) utilizes MeV ion beams to determine non-destructively the elemental composition of the near-surface region of solids (0-1 micrometer). Rutherford-backscattering (RBS), Elastic Recoil Detection Analysis (ERDA) and Particle Induced X-Ray Emission (PIXE) will be discussed in detail.