C. Additional teaching
280190 VO+UE 3 ECTS [de en] Microstructure analysis using Scanning Electron Microscopy and Ion Beam Technique
Abart, Tu 15:15-17:00 (15×)
Göd, Mo 13:30-15:00 (14×)
Decker
Richter
Krämer, Tu 09:15-10:45 (16×)
Wanek, We 16:15-18:30 (15×)
Wanek
Dordevic
Last modified: We 13.06.2018 00:38