W0_28_66 Deepening in earth-scientific themes II
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280190 VO+UE 3 ECTS [ de en ] Microstructure analysis using Scanning Electron Microscopy and Ion Beam TechniqueAbart, Tu 15:15-17:00 (15×)
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Göd, Mo 13:30-15:00 (14×)
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Petrakakis, Tu 17:00-19:00 (16×), We 16:00-18:00 (16×), Th 16:00-18:00 (15×), Fr 14:00-16:00 (14×)
Last modified: We 13.06.2018 00:38