W0_65 Deepening in earth-scientific themes I
280190 VO+UE 3 ECTS [de en] Microstructure analysis using Scanning Electron Microscopy and Ion Beam Technique
Abart, Tu 15:15-17:00 (15×)
Göd, Mo 13:30-15:00 (14×)
Petrakakis, Tu 17:00-19:00 (16×), We 16:00-18:00 (16×), Th 16:00-18:00 (15×), Fr 14:00-16:00 (14×)
Last modified: We 13.06.2018 00:38