3.7. Specialization in Materials Physics
Fachspezifisches Höheres Praktikum 6 Std. (siehe auch Zweiter Studienabschnitt 2.7.1.) und weitere Lehrveranstaltungen 8 Std. (siehe auch Zweiter Studienabschnitt 2.7.2.)
Tolédano
260044 VO 1.5 ECTS Physics of surfaces and ultrathin films - Physics of surfaces and ultrathin films
Biedermann
Golser
260050 VO 2 ECTS Magnetic resonance - Magnetic resoance: principles and applications in material sciences, biology and quantum computing
Simon
Kresse, Tu 14:45-16:15 (13×)
Fuith
260026 VO 5 ECTS [en] Phenomena & properties of nanostructured materials - Phenomena and properties of nanostructured materials
Karnthaler
260066 SE 6 ECTS Sem. on appl. of high-temperature superconductors - Seminar on applications of high-temperature superconductors
Lang, Mo 14:00-15:30 (13×)
Karnthaler
Pfeiler
260053 SE 3 ECTS Recent results in solid state spectroscopy - Recent results in solid state spectroscopy
Kuzmany, Tu 16:00-17:30 (6×)
260033 SE 8 ECTS Recent topics of materials physics - Recent topics of materials physics (Electron microscopical studies)
Karnthaler, Th 10:00-12:15 (14×)
260039 SE 8 ECTS Defects, kinetics, electronic structure of alloys - Defects, kinetics and electronic structure of alloys
Pfeiler, Tu 14:30-15:30 (13×)
Zehetbauer, We 14:15-15:45 (15×)
Weiss
Hafner
260226 SE 8 ECTS Seminar of the Institute of Materials Physics - Seminar of the Institute of Materials Physics
Karnthaler, We 16:15-18:30 (13×)
Karnthaler
Rogl
Pichler
260067 VO 3 ECTS [en] Phase Equilibrium and Separation in Alloy Systems - Phase Equilibrium and Phase Separation in Alloy Systems
Mohri
260073 SE 2 ECTS [en] First-Princip. Calc. of Disorder Phase Boundaries - First-Principles Calculations of Disorder Phase Boundaries
Mohri
Howe
260087 SE 2 ECTS [en] Electron Microscopy of Phase Transformations - Electron Microscopy of Phase Transformations
Howe
Tsuchiya
Tsuchiya
260095 VO 2 ECTS [de en] Dynamic Electron Scattering - Dynamic Electron Scattering and Advanced Electron Optics
Thust
260099 SE 2 ECTS [de en] High Resolution Transmission Electron Microscopy - Aberrations and their Correction in High Resolution Transmission Electron Microscopy
Thust
Last modified: We 13.06.2018 00:34