3.7. Specialization in Materials Physics
Fachspezifisches Höheres Praktikum 6 Std. (siehe auch Zweiter Studienabschnitt 2.7.1.) und weitere Lehrveranstaltungen 8 Std. (siehe auch Zweiter Studienabschnitt 2.7.2.)
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Tolédano
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260044 VO 1.5 ECTS Physics of surfaces and ultrathin films - Physics of surfaces and ultrathin filmsBiedermann
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Golser
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260050 VO 2 ECTS Magnetic resonance - Magnetic resoance: principles and applications in material sciences, biology and quantum computingSimon
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Kresse, Tu 14:45-16:15 (13×)
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Fuith
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260026 VO 5 ECTS [ en ] Phenomena & properties of nanostructured materials - Phenomena and properties of nanostructured materialsKarnthaler
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260066 SE 6 ECTS Sem. on appl. of high-temperature superconductors - Seminar on applications of high-temperature superconductorsLang, Mo 14:00-15:30 (13×)
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Karnthaler
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Pfeiler
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260053 SE 3 ECTS Recent results in solid state spectroscopy - Recent results in solid state spectroscopyKuzmany, Tu 16:00-17:30 (6×)
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260033 SE 8 ECTS Recent topics of materials physics - Recent topics of materials physics (Electron microscopical studies)Karnthaler, Th 10:00-12:15 (14×)
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260039 SE 8 ECTS Defects, kinetics, electronic structure of alloys - Defects, kinetics and electronic structure of alloysPfeiler, Tu 14:30-15:30 (13×)
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Zehetbauer, We 14:15-15:45 (15×)
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Weiss
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Hafner
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260226 SE 8 ECTS Seminar of the Institute of Materials Physics - Seminar of the Institute of Materials PhysicsKarnthaler, We 16:15-18:30 (13×)
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Karnthaler
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Rogl
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Pichler
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260067 VO 3 ECTS [ en ] Phase Equilibrium and Separation in Alloy Systems - Phase Equilibrium and Phase Separation in Alloy SystemsMohri
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260073 SE 2 ECTS [ en ] First-Princip. Calc. of Disorder Phase Boundaries - First-Principles Calculations of Disorder Phase BoundariesMohri
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Howe
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260087 SE 2 ECTS [ en ] Electron Microscopy of Phase Transformations - Electron Microscopy of Phase TransformationsHowe
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Tsuchiya
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Tsuchiya
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260095 VO 2 ECTS [ de en ] Dynamic Electron Scattering - Dynamic Electron Scattering and Advanced Electron OpticsThust
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260099 SE 2 ECTS [ de en ] High Resolution Transmission Electron Microscopy - Aberrations and their Correction in High Resolution Transmission Electron MicroscopyThust
Last modified: We 13.06.2018 00:34