MA-ERD-W-3.3 Field emission scanning electron microscopy and ion beam applications (5 ECTS)

• 280122 UE 3 ECTS [ de en ] Field Emission Scanning Electron Microscopy and Ion Beam Applications
  Habler, Th 12.10. 14:30-15:00, Th 15.02. 09:30-12:00, Th 15.02. 13:15-14:30